Various metals, including zinc (Zn), nickel (Ni), aluminum (Al), chromium\n(Cr), gallium (Ga), lead (Pb), copper (Cu) and indium (In), may be released\nand cause contamination when scrapped end-of-life (EoL) Cu(InGa)Se2\nthin-film solar panel (CIGS TFSP) is buried in the soil. In this study, we grew\nBrassica parachinensis L. H. Bariley (VegBrassica) in three different types of\nsoils, namely, a commercial soil, a Mollisol, and an Oxisol, which had been\ncontaminated by CIGS TFSP to various extents. The concentrations of contaminants\nin these soils were positively correlated with both the amount of\nCIGS TFSP added and the burial period. Plants grew well in commercial soil\nand Mollisol, but those in Oxisol showed prominent signs of chlorosis and\ndied after 30 days. The bioaccumulation factor (BF) and concentration of Zn\nin VegBrassica grown in commercial soil with 10% of CIGS TFSP added were\n3.61 and 296 mg/kg, respectively, while the BF and concentration of In of\nVegBrassica grown in Mollisol were 3.80 and 13.72 mg/kg, respectively. The results\nshowed that soils were contaminated by metals released from CIGS\nTFSP, and different adsorption patterns were observed for VegBrassica depending\non which types of metals associated with the soil properties.
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